| 缺陷類型 | defect type | High current: hidden cracks, chip fragments, low-efficiency cells, sintered grid lines, material defects, broken grids. Low current: low-efficiency cells. | “大電流:隱藏裂紋、芯片碎片、低效率電池、燒結(jié)柵線、材料 缺陷、破損柵格。 低電流:低效率電池?!?/span> |
| 軟件處理 | software processing | Zoom function, barcode display, local data query, integration with MES system, high current detection, low current detection, support for foot pedal triggering, ,scanner triggering, and overcurrent protection.
| 縮放功能、條碼顯示、本地?cái)?shù)據(jù)查詢、與MES系統(tǒng)集成、 高電流檢測、低電流檢測、支持腳踏板觸發(fā)、掃描儀觸發(fā)、過流保護(hù)。 |